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Measuring times of only a few seconds
Compact and simple design
- Saves money through low-cost entry and saves space in your inspection room or production environment
Accurate results
- Thanks to 0.1 nm (.004 μin) vertical resolution
- Thanks to compact, reliable design
- Thanks to tried-and-tested evaluation oftware from Mahr
MarSurf WS 1 gives you a competitive edge
- Innovation in optical surface metrology
- Excellent vibration absorption (patent pending)
- Very small sensor dimensions
- Can be used in the workshop and laboratory
Description
High-precision, non-contact measurement of surface texture
Nowadays, the properties of surface topographies are increasingly influenced by new processing methods and new materials.
The traditional profile stylus method is often not adequate to characterize the functional behavior of surfaces. Three-dimensional recording and evaluation are required. Soft and thin-walled materials also require non-contact measurement.
Moreover, ever higher levels of surface quality are being achieved, greatly increasing the requirements placed on measuring systems in terms of resolution and measuring accuracy.
The MarSurf WS 1 satisfies all these requirements:
- Vertical resolution 0.1 nm (.004 μin)
- Three-dimensional measurement and evaluation in only a few seconds
- Compact measuring station configuration for the workshop and laboratory
- MarSurf XT 20 software
- Topographical evaluation software on the fully standardized and powerful MarWin software platform
Applications
The MarSurf WS 1 can be used both in precision inspection rooms and production environments. Other optical measuring principles quickly reach their limits when measuring various types of surfaces.
Some cannot handle high surface reflectiveness while others cannot measure rough surfaces properly if, indeed, at all.
The MarSurf WS 1 and its innovative measuring signal evaluation enables analysis of both reflective and rough workpieces. For example, the high vertical resolution allows you to measure the surface roughness of optical components such as lenses or mirrors with sub-μm accuracy. You are also able to measure the texture of micromechanical components. The material involved is irrelevant here.
- Glass
- Paper
- Varnish
- Metal
- Plastic
- Coatings
- Liquids can be measured.
The MarSurf XT 20 topography software is a powerful evaluation tool with a wide range of functions. Thanks to the standardized MarWin software platform, you are also able to enjoy the benefits of the tried-and-tested MarSurf XC 20 contour software.
Please click on PDF icon above for MarSurf WS 1 flyer download (PDF 292KB).
